Archives of Acoustics,
11, 3, pp. 299-312, 1986
An acoustic microscope in measurements of mechanical properties of surface layers – V(z)
The V(z) measuring technique, i.e. the application of the acoustic micro-scope as a measurement tool is presented and explained. In the measurements, the pressure amplitude distribution on the surface of the lens is controlled in a certain range, enabling V(z) curves to be optimized with respect to oscillation amplitudes obtained for the given material.
V(z) curves obtained with this set-up and calculated from them Rayleigh wave velocities are included in the paper. The possibility of using such a set-up in thin film measurements has been pointed out.
V(z) curves obtained with this set-up and calculated from them Rayleigh wave velocities are included in the paper. The possibility of using such a set-up in thin film measurements has been pointed out.
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Copyright © Polish Academy of Sciences & Institute of Fundamental Technological Research (IPPT PAN).
References
R. A. LEMONS, Acoustic microscopy by mechanical scanning, Internal Memorandum, The J. A. Hartford Foundation, Stanford 1975.
C. F. QUATE, Microwaves, acoustics and scanning microscopy, Scanned Image Microscopy, E. A. Ash., Ed. Academic Press, London 1980, 23-55.
A. ATALAR, An angular speculum approach to contrast in reflection acoustic microscopy, Journal of Applied Physics, 49, 10, 5130-5139 (1978).
R. G. WILSON, R. D. WEGLEIN, Acoustic microscopy of materials and surface layers, Journal of Applied Physics, 55, 9, 3261-3275 (1984).